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Depth Profiling Study of the CdTe/CdS/ITO/Glass Heterostructure with AES and GIXRD
Author(s) -
Martel A.,
CaballeroBriones F.,
Oliva A.I.,
CastroRodríguez R.,
Iribarren A.,
BartoloPérez P.,
Peña J.L.
Publication year - 2000
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200007)220:1<261::aid-pssb261>3.0.co;2-4
Subject(s) - materials science , heterojunction , cadmium telluride photovoltaics , auger electron spectroscopy , chemical bath deposition , sublimation (psychology) , analytical chemistry (journal) , crystallography , optoelectronics , nanotechnology , thin film , chemistry , psychology , physics , chromatography , nuclear physics , psychotherapist
In this work we use Auger electron spectroscopy depth profiling and grazing incidence X‐ray diffraction (GIXRD) to study chemical composition and structure of the CdTe/CdS/ITO/glass heterostructure. The CdS layer was deposited on ITO (In 2 Sn 2 O 7– x ) substrates by chemical bath deposition and the CdTe film was deposited by double‐step close space sublimation. We found by AES profiling a strong intermixing at the CdS/ITO and CdS/CdTe interfaces, confirmed by GIXRD and evidences of two diffusion steps for the CdS into the ITO matrix. Additionally, the CdS/ITO structure was separately investigated in order to know the influence of the substrate roughness on the heterostructure conformation. The morphology of the ITO substrate and the as‐deposited CdS layer was studied by atomic force microscopy. The use of GIXRD showed to be useful to study the entire CdTe/CdS/ITO/glass heterostructure. The ITO roughness has proved to be an influencing factor in the structural features and suggested that CdS roughness can also influence the observed composition profiles.