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Infrared 45° Reflectometry of Anisotropic Ultrathin Films and Heterostructures
Author(s) -
SilvaCastillo A.,
PérezRodríguez F.
Publication year - 2000
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200005)219:1<215::aid-pssb215>3.0.co;2-4
Subject(s) - reflectometry , anisotropy , superlattice , optics , infrared , materials science , substrate (aquarium) , phonon , heterojunction , reflectivity , condensed matter physics , thin film , optoelectronics , physics , nanotechnology , geology , time domain , oceanography , computer science , computer vision
The theory of infrared 45° reflectometry is revised and generalized to the case of anisotropic very‐thin films and heterostructures on substrate. We obtain approximate expressions for the difference Δ 45 = R p — R s 2 between the reflectivity for p‐polarized light ( R p ) and the squared reflectivity for s‐polarized light ( R s 2 ) at 45° angle of incidence. These results give a good interpretation of frequency spectra of Δ 45 and allow to associate correctly the resonances in Δ 45 with transverse and longitudinal optical phonons in anisotropic films. The application of the infrared 45° reflectometry to superlattices is discussed.