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Noise Phenomena in Semiconductor Transport
Author(s) -
Varani L.
Publication year - 1997
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(199711)204:1<442::aid-pssb442>3.0.co;2-2
Subject(s) - noise (video) , flicker noise , statistical physics , semiconductor , acoustics , noise measurement , physics , computer science , noise figure , optoelectronics , noise reduction , artificial intelligence , amplifier , cmos , image (mathematics)
Different aspects of fluctuation phenomena in semiconductors are reciewed. After a brief recall of the basic theoretical properties, the main numerical technique to obtain noise spectra are described. The main attention is drawn to the extraction of microscopic physical information from noise properties. To this end, several cases of interest are described, namely: relation between noise and characteristic times of the system, decomposition of noise spectra, noise properties in devices, discussion of the concept of noise temperature and noise in ballistic systems.