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Defect Studies in a One‐Dimensional Photonic Band Gap Structure
Author(s) -
Wang Rongzhou,
Dong Jinming,
Xing D. Y.
Publication year - 1997
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(199704)200:2<529::aid-pssb529>3.0.co;2-i
Subject(s) - stack (abstract data type) , optics , transmission coefficient , transfer matrix method (optics) , materials science , transmission (telecommunications) , wavelength , refractive index , amplitude , nonlinear system , transfer matrix , position (finance) , photonic crystal , layer (electronics) , band gap , beam (structure) , physics , optoelectronics , telecommunications , engineering , finance , quantum mechanics , computer science , economics , computer vision , programming language , composite material
We calculate defect modes in a finite one‐dimensional quarter‐wavelength stack by the transfer matrix technique, and find that the defect mode frequency depends on the refractive index as well as on the thickness of the defect layer and the transmission coefficient depends on its position. Then, by using the extended‐beam‐propagation method, we investigate the short pulse transmission. It is found that the amplitude of the electromagnetic field in the defect layer is much larger than that of the incident light, which can be used to enhance nonlinear effects if the defect layer is replaced by a nonlinear material.