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X‐Ray Diffraction Study of Amorphous Ge(Se 1—x Te x ) 2 Alloys
Author(s) -
Uemura O.,
Hayasaka N.,
Kameda Y.,
Usuki T.
Publication year - 1997
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(199704)200:2<385::aid-pssb385>3.0.co;2-i
Subject(s) - tetrahedron , crystallography , diffraction , coordination number , covalent bond , bond length , amorphous solid , raman spectroscopy , ion , raman scattering , materials science , x ray crystallography , radial distribution function , chemistry , crystal structure , physics , computational chemistry , optics , molecular dynamics , organic chemistry
X‐ray diffraction and Raman scattering measurements have been carried out on amorphous Ge(Se 1— x Te x ) 2 alloys with x = 0 to 0.70. The first peak area of the distribution function indicates that the coordination number of Ge is nearly four at any of the compositions covered, suggesting that tetrahedral units having Ge at the central site are formed in the system. Further, Raman vibrational modes corresponding to five anion‐mixed GeX (4— n )/2 Y n /2 tetrahedral units were observed in this alloy. The Ge–Te bond length, 0.261 nm, in the anion‐mixed tetrahedra, obtained by the least squares fitting procedure for X‐ray intensity functions is closer to the sp 3 ‐orbital covalent distance, similar to the Ge–Se bond length, which also evidences the existence of the tetrahedral units in the system.