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Optical Properties of CuInSe 2 Bulk Material Characterized by a Fixed Polarizer–Rotating Analyzer Spectroscopic Ellipsometer
Author(s) -
Hidalgo M. L.,
Lachab M.,
Zouaoui A.,
Alhamed M.,
Llinares C.,
Peyrade J. P.,
Galibert J.
Publication year - 1997
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(199703)200:1<297::aid-pssb297>3.0.co;2-c
Subject(s) - polarizer , ellipsometry , spectrum analyzer , materials science , analytical chemistry (journal) , optics , band gap , wavelength , refractive index , molecular physics , optoelectronics , chemistry , thin film , physics , nanotechnology , birefringence , chromatography
In the present paper, we have investigated the optical properties of CuInSe 2 single and polycrystals using a broad band fixed polarizer–rotating analyzer spectroscopic ellipsometer (RAE) in the spectral range 250 to 1700 nm. The wavelength dependence of CuInSe 2 optical constants was studied assuming a two‐phase system: the ambient medium and the sample. We have determined interband transition energies near and above the bandgap by a detailed analysis of the absorption spectrum and through the third joint‐density‐of‐states (JDOS) derivative computation. Measurements were carried out on nearly‐stoichiometric and In‐rich CuInSe 2 substrates.