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Thickness Dependence of the Melting Temperature of Thin Polymer Films
Author(s) -
Kim Jae Hyun,
Jang Jyongsik,
Zin WangCheol
Publication year - 2001
Publication title -
macromolecular rapid communications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.348
H-Index - 154
eISSN - 1521-3927
pISSN - 1022-1336
DOI - 10.1002/1521-3927(20010301)22:6<386::aid-marc386>3.0.co;2-s
Subject(s) - materials science , thin film , polymer , wafer , ellipsometry , lamellar structure , composite material , silicon , melting temperature , polymer chemistry , nanotechnology , optoelectronics
The melting temperature ( T m ) of thin poly[ethylene‐ co ‐(vinyl acetate)] films coated on a silicon wafer was investigated. Ellipsometry was used to measure the T m which was found to decrease dramatically when the thickness of the film is less than 300 Å. The relationship between the lamellar thickness and the T m was thought to be responsible this thickness dependence of the T m in thin polymer films.