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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations
Author(s) -
Giessibl F.J.,
Bielefeldt H.,
Hembacher S.,
Mannhart J.
Publication year - 2001
Publication title -
annalen der physik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.009
H-Index - 68
eISSN - 1521-3889
pISSN - 0003-3804
DOI - 10.1002/1521-3889(200111)10:11/12<887::aid-andp887>3.0.co;2-b
Subject(s) - conductive atomic force microscopy , atomic force microscopy , materials science , scanning tunneling microscope , atomic orbital , molecular physics , resolution (logic) , non contact atomic force microscopy , atomic physics , physics , nanotechnology , quantum mechanics , electron , artificial intelligence , computer science
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)‐(7 × 7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip‐sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)‐(7 × 7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.