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Probing the Spatial Distribution and Morphology of Supported Nanoparticles Using Rutherford‐Scattered Electron Imaging
Author(s) -
Midgley Paul A.,
Weyland Matthew,
Thomas John Meurig,
Gai Pratibha L.,
Boyes Edward D.
Publication year - 2002
Publication title -
angewandte chemie international edition
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.831
H-Index - 550
eISSN - 1521-3773
pISSN - 1433-7851
DOI - 10.1002/1521-3773(20021018)41:20<3804::aid-anie3804>3.0.co;2-g
Subject(s) - scanning transmission electron microscopy , dark field microscopy , electron tomography , materials science , scattering , electron , transmission electron microscopy , nanoparticle , electron scattering , optics , scanning confocal electron microscopy , scanning electron microscope , microscopy , nanotechnology , physics , nuclear physics
Images of supported nanoparticle catalysts have been recorded by scanning transmission electron microscopy (STEM), with a combination of high‐angle annular dark‐field (HAADF) imaging and back‐scattered electron (BSE) imaging, which both utilize Rutherford‐scattered electrons. The incoherent scattering process ensures that images are ideal for electron tomography and the reconstruction of 3D nanoparticle distributions (such as palladium on carbon, see picture).