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A generalized model for the economic design of x̄control charts for production systems with increasing failure rate and early replacement
Author(s) -
Rahim M. A.,
Banerjee P. K.
Publication year - 1993
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/1520-6750(199310)40:6<787::aid-nav3220400605>3.0.co;2-4
Subject(s) - weibull distribution , failure rate , computer science , production (economics) , sampling (signal processing) , control chart , extension (predicate logic) , control (management) , econometrics , mathematical optimization , operations research , statistics , mathematics , economics , macroeconomics , artificial intelligence , filter (signal processing) , process (computing) , computer vision , programming language , operating system
This article generalizes the model for the economic design of x̄‐control charts of Duncan [4], starting from the more recent papers of Lorenzen and Vance [8] and Banerjee and Rahim [3]. The classical model of Duncan [4] and its several extensions including the unified model of Lorenzen and Vance [8] assumed exponentially distributed in‐control periods and provided uniform sampling schemes. Banerjee and Rahim [3], however, assumed a Weibull‐distributed in‐control period having an increasing failure rate and used variable sampling intervals. The present article is an extension of the work of Banerjee and Rahim [3], where a general distribution of in‐control periods having an increasing failure rate is assumed and the possibility of age‐dependent repair before failure is considered. Several different truncated and nontruncated probability models are chosen. It is proposed that economic benefits can be achieved by adopting a nonuniform inspection scheme and by truncating a production cycle when it attains a certain age. Numerical examples are presented to support this proposition. Finally, the effect of model specification in the choice of failure mechanism is investigated. © 1993 John Wiley & Sons, Inc.