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Using aggregated cumulative hazard plots to visualize failure data
Author(s) -
Nevell David
Publication year - 2000
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/1099-1638(200005/06)16:3<209::aid-qre326>3.0.co;2-p
Subject(s) - weibull distribution , complement (music) , hazard , plot (graphics) , reliability (semiconductor) , computer science , range (aeronautics) , reliability engineering , statistics , data mining , econometrics , mathematics , engineering , chemistry , organic chemistry , biochemistry , power (physics) , physics , quantum mechanics , complementation , gene , phenotype , aerospace engineering
The purpose of this paper is to demonstrate how the aggregated cumulative hazard (ACH) plot can be used to complement and extend standard Weibull analyses for non‐repairable items. It looks at the shortcomings of using probability plots in isolation and shows how ACH plots can overcome these problems. Several examples are then described covering a range of applications. ACH plots often suggest particular types of models. The three‐parameter mixture model is considered in detail. The paper concludes that ACH plots can be regarded as the focal point of a unified and holistic approach to pragmatic part level reliability and safety analysis. Copyright © 2000 John Wiley & Sons, Ltd.