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Electromagnetic measurement in a mode‐stirred chamber
Author(s) -
Tristant F.,
Moreau J. P.,
Levesque P.
Publication year - 2001
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20010320)28:6<417::aid-mop1058>3.0.co;2-1
Subject(s) - mode (computer interface) , electrical engineering , physics , acoustics , engineering , materials science , computer science , operating system
This paper describes an electromagnetic‐field distribution measurement technique used in a mode‐stirred chamber. The technique is based on the electromagnetic infrared method developed at ONERA. The paper shows the electric‐field distribution characteristics (average, min, max, standard deviation, and spatial distribution) at discrete frequencies. The efficiency of the method is demonstrated by showing that, with a few sets of measurements, the electromagnetic‐field distribution in a mode‐stirred chamber can be evaluated. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 28: 417–421, 2001.