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Port‐match optimization of microwave low‐noise amplifiers
Author(s) -
Eccleston K. W.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20001205)27:5<321::aid-mop11>3.0.co;2-p
Subject(s) - microwave , electronic engineering , reflection coefficient , noise (video) , low noise amplifier , amplifier , port (circuit theory) , reflection (computer programming) , y factor , effective input noise temperature , computer science , noise figure , measure (data warehouse) , engineering , electrical engineering , telecommunications , cmos , artificial intelligence , image (mathematics) , programming language , database
The traditional approach to microwave low‐noise amplifier design is to use graphical aids involving gain, noise, mismatch, and stability circles. In this paper, we propose a method, which avoids graphical methods, and uses a formula for the source reflection coefficient to minimize noise measure, and a robust numerical method for the load reflection coefficient to optimize the match at each port. The method is tested on a number of different transistors. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 321–323, 2000.