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Characterization of a single‐step microstrip discontinuity in a substrate using the finite‐difference time‐domain method
Author(s) -
Chun JoongChang,
Park W. S.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20001120)27:4<245::aid-mop7>3.0.co;2-1
Subject(s) - discontinuity (linguistics) , finite difference time domain method , hfss , microstrip , microwave , microstrip antenna , equivalent circuit , electronic engineering , patch antenna , engineering , antenna (radio) , acoustics , materials science , electrical engineering , mathematical analysis , optics , physics , mathematics , telecommunications , voltage
A single‐step microstrip discontinuity in a substrate is characterized using the finite‐difference time‐domain (FDTD) method, and an equivalent circuit model has been developed. The microstrip discontinuity newly introduced in this paper has a substrate thickness change in the longitudinal direction with a uniform strip width. The discontinuity has applications in patch antenna feed design and interconnections between microwave circuit modules. The simulation results are compared with those computed by HFSS to show good agreement. An equivalent circuit developed from the FDTD results, which is accurate within 2.4% in magnitudes of S 11 and S 21 , can be applied for computer‐aided designs. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 245–248, 2000.