Premium
A semianalytical approach for the evaluation of radiated immunity on a printed‐circuit board in metallic enclosures
Author(s) -
Azaro R.,
Caorsi S.,
Cosso M.,
Costini G. M.,
Donelli M.,
Ene R.,
Gragnani G. L.,
Pastorino M.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20001105)27:3<204::aid-mop17>3.0.co;2-g
Subject(s) - printed circuit board , enclosure , microwave , engineering , finite element method , acoustics , polarization (electrochemistry) , scattering , electronic engineering , physics , electrical engineering , optics , structural engineering , telecommunications , chemistry
In this letter, a semianalytical formulation to evaluate the radiated immunity in a printed‐circuit board placed into a rectangular metallic box with rectangular apertures is presented. Both electric and magnetic fields can be calculated as a function of the enclosure dimensions, apertures dimensions, frequency, polarization, and incident direction of a wave impinging on the metallic enclosure. Some results obtained by using a simulator developed on the basis of the proposed formulation are presented and compared with independent results obtained both by using an analytical model, an FEM‐based numerical code, and experimental data obtained by means of a modulated scattering technique (MST). © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 204–207, 2000.