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A combined MRTD/FDTD approach to analyze local characteristics of lumped elements
Author(s) -
Ju Saehoon,
Bae DuckHo,
Kim Hyeongdong
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20001105)27:3<190::aid-mop12>3.0.co;2-9
Subject(s) - finite difference time domain method , microwave , electronic engineering , wavelet , time domain , electronic circuit , engineering , algorithm , computer science , physics , electrical engineering , telecommunications , optics , artificial intelligence , computer vision
This letter presents a modeling method of lumped elements by using the Haar‐wavelet MRTD (multiresolution time‐domain) technique. With the MRTD technique, the conventional FDTD method is partly used to describe the localized characteristics of the lumped elements, which improves the analysis accuracy of the circuits with lumped elements. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 190–192, 2000.