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Surface image generation using local slope‐based mapping algorithm
Author(s) -
Pal Sarit,
Kak S. K.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20000720)26:2<127::aid-mop18>3.0.co;2-3
Subject(s) - surface (topology) , pixel , surface roughness , microwave , surface finish , image (mathematics) , surface reconstruction , algorithm , optics , computer science , materials science , computer vision , artificial intelligence , mathematics , geometry , physics , telecommunications , composite material
This paper introduces a novel technique to provide the microtopographical details of a machined surface using a fiber‐optic probe. Unlike the previous methods, the present approach involves pixel‐to‐pixel scanning for slope measurement, which in turn generates the three‐dimensional profile of the probed surface using the relevant mapping algorithm. Minute details of the surface roughness characteristics, including slope and height at different positions, can be visualized from the reconstructed surface image. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 26: 127–132, 2000.