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A simple free‐space method for measuring the complex permittivity of single and compound dielectric materials
Author(s) -
Kumar S. Biju,
Raveendranath U.,
Mohanan P.,
Mathew K. T.,
Hajian M.,
Ligthart L. P.
Publication year - 2000
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/1098-2760(20000720)26:2<117::aid-mop14>3.0.co;2-i
Subject(s) - dielectric , permittivity , simple (philosophy) , microwave , distributive property , materials science , dielectric permittivity , relative permittivity , free space , space (punctuation) , electronic engineering , computer science , optics , optoelectronics , physics , mathematics , engineering , telecommunications , pure mathematics , philosophy , epistemology , operating system
A simple and efficient method for determining the complex permittivity of dielectric materials from both reflected and transmitted signals is presented. It is also novel because the technique is implemented using two pyramidal horns without any focusing mechanisms. The dielectric constant of a noninteractive and distributive (NID) mixture of dielectrics is also determined. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 26: 117–119, 2000.