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Self‐assembled multilayer films based on diazoresins studied by atomic force microscopy/friction force microscopy
Author(s) -
Huang Lan,
Luo Guobin,
Zhao Xinsheng,
Chen Jinyu,
Cao Weixiao
Publication year - 2000
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/1097-4628(20001017)78:3<631::aid-app190>3.0.co;2-v
Subject(s) - monolayer , atomic force microscopy , materials science , covalent bond , microscopy , ionic bonding , layer (electronics) , surface finish , composite material , diffraction , electrostatic force microscope , nanotechnology , chemistry , optics , ion , organic chemistry , physics
The layer‐by‐layer self‐assembled NDR‐PSS (nitro‐containing diazoresin‐polysodium p ‐styrenesulfonate) films were fabricated. The crosslinking structure formed from the conversion of ionic bond to covalent bond after UV irradiation, confirmed by small angle X‐ray diffraction. The roughness and microtribological properties of NDR‐PSS films were investigated by atomic force microscopy/friction force microscopy. The ordered multilayer films after photoreaction are better in microtribological performance than that of the monolayer film. © 2000 John Wiley & Sons, Inc. J Appl Polym Sci 78: 631–638, 2000