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Determination of components in refractories containing zirconia by x‐ray fluorescence spectrometry
Author(s) -
Asakura Hideo,
Ikegami Katsusige,
Murata Mamoru,
Wakita Hisanobu
Publication year - 2000
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/1097-4539(200011/12)29:6<418::aid-xrs445>3.0.co;2-p
Subject(s) - cubic zirconia , mass spectrometry , calibration curve , analytical chemistry (journal) , materials science , calibration , chemistry , chromatography , detection limit , metallurgy , ceramic , physics , quantum mechanics
For the purpose of proposing the use of a series of reference materials (SeRMs) for x‐ray fluorescence spectrometry (XRFS) of refractories containing zirconia, we examined several methods of chemical analysis, and completed two Japanese Industrial Standard (JIS) methods of analysis for zircon and/or zirconia (ZS) and alumina, zirconia and silica (AZS) and two SeRMs of Japanese Refractory Reference Materials (JRRM) (10 samples per series). Inductively coupled plasma atomic emission spectrometry and XRFS were employed for the determination of HfO 2 . For XRFS analysis especially, a ZrO 2 HfO 2 binary calibration curve is employed using synthetic standard samples (with Hf Mα as an analysis line). The compositions of both series, 3–92 mass% for ZrO 2 and 0.2–46 mass% for SiO 2 , cover a wide range of values. A high‐precision calibration curve could be produced from these SeRMs. The content of HfO 2 , which has rarely undergone analysis to date, was 1.6 mass% for zirconia and 1.3–1.4 mass% for zircon. These SeRMs are also registered in the Code d'Indexation des Materiaux de Reference (COMAR). Copyright © 2000 John Wiley & Sons, Ltd.