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Calculation features of the fundamental parameter method in XRF
Author(s) -
Kitov B. I.
Publication year - 2000
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/1097-4539(200007/08)29:4<285::aid-xrs428>3.0.co;2-c
Subject(s) - uniqueness , convergence (economics) , reliability (semiconductor) , task (project management) , computer science , systematic error , algorithm , mathematics , mathematical optimization , reliability engineering , statistics , mathematical analysis , engineering , physics , power (physics) , systems engineering , quantum mechanics , economics , economic growth
This paper examines the general characteristics of the fundamental parameter method such as the accuracy of the task, the conditions of the solution availability, the uniqueness and the reliability of the solution convergence in iteration processes. A regulating procedure is suggested to reduce the systematic error, preserving at the same time the small number of standard samples. Copyright © 2000 John Wiley & Sons, Ltd.