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Molybdenum x‐ray emission spectroscopic study of vacancy‐induced electronic states in V 2 O 5 –MoO 3 thin films and powders
Author(s) -
Acharya B. S.,
Pradhan L. D.,
Mishra Pusparani,
Nayak B. B.
Publication year - 2000
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/1097-4539(200007/08)29:4<279::aid-xrs426>3.0.co;2-7
Subject(s) - thin film , molybdenum , vacancy defect , stoichiometry , materials science , full width at half maximum , analytical chemistry (journal) , crystallography , chemistry , metallurgy , nanotechnology , optoelectronics , chromatography
X‐ray emission spectra in compound thin films are scarce, although such studies in metals, alloys and other inorganic compounds are available. In this study, compound thin films of V 2 O 5 –MoO 3 and powders of same compositions were investigated to see the effect of V 2 O 5 incorporation in an MoO 3 matrix. For this purpose, Kβ, Lα and Lβ emissions from Mo present in these matrices were measured. The full width at half‐maximum (FWHM) of Lα 2 and Lβ 1 in thin films were found to be different from that of powders. Most of these emission bands show a low asymmetry index before these are split into separate bands. All these findings have been explained on the basis of vacancy production, core hole lifetime, crystal structure and stoichiometric variation of MoO 3 in the V 2 O 5 matrix. Copyright © 2000 John Wiley & Sons, Ltd.