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Secondary ion mass spectrometry in the characterisation of boron‐based ceramics
Author(s) -
Daolio S.,
Fabrizio M.,
Piccirillo C.,
Muolo M. L.,
Passerone A.,
Bellosi A.
Publication year - 2000
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/1097-0231(20010115)15:1<1::aid-rcm183>3.0.co;2-i
Subject(s) - secondary ion mass spectrometry , chemistry , ceramic , nickel , boron , analytical chemistry (journal) , hydrogen , mass spectrometry , cubic zirconia , static secondary ion mass spectrometry , chromatography , organic chemistry
Abstract A secondary ion mass spectrometry (SIMS) study of Zr‐ and Ti‐based borides is reported: ZrB 2 ceramic samples (with and without nickel addition) and a TiB 2 ‐Ni‐B 4 C/Cu joint were investigated. For Zr‐based samples, SIMS measurements show evidence for induced effects by the presence of nickel with regard to oxygen and hydrogen absorption and zirconia formation. In the case of the TiB 2 ‐Ni‐B 4 C/Cu joint, the ceramic‐metal interface region was analysed and the extent of Cu diffusion into the ceramic material was established. SIMS results were in agreement with previously obtained SEM‐EDS data. Copyright © 2001 John Wiley & Sons, Ltd.