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On curvature element‐size control in metric surface mesh generation
Author(s) -
Lee C. K.
Publication year - 2001
Publication title -
international journal for numerical methods in engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.421
H-Index - 168
eISSN - 1097-0207
pISSN - 0029-5981
DOI - 10.1002/1097-0207(20010210)50:4<787::aid-nme51>3.0.co;2-o
Subject(s) - curvature , mesh generation , metric tensor , metric (unit) , polygon mesh , parametric surface , finite element method , parametric statistics , surface (topology) , mathematics , geometry , intersection (aeronautics) , computer science , mathematical optimization , algorithm , engineering , structural engineering , geodesic , aerospace engineering , operations management , statistics
A new procedure is suggested for controlling the element‐size distribution of surface meshes during automatic adaptive surface mesh generation. In order to ensure that the geometry of the surface can be accurately captured, the curvature properties of the surface are first analysed. Based on the principal curvatures and principal directions of the surface, the curvature element‐size requirement is defined in the form of a metric tensor field. This element‐size controlling metric tensor field, which can either be isotopic or anisotopic depending on the user requirement, is then employed to control the element size distribution during mesh generation. The suggested procedure is local, adaptive and can be easily used with many parametric surface mesh generators. As the proposed scheme defines the curvature element‐size requirement in an implicit manner, it can be combined with any other user defined element size specification using the standard metric intersection procedure. This eventually leads to a simple implementation procedure and a high computational efficiency. Numerical examples indicate that the new procedure can effectively control the element size of surfacemeshes in the cost of very little additional computational effort. Copyright © 2001 John Wiley & Sons, Ltd.