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GDOES depth profiling analysis of the air‐formed oxide film on a sputter‐deposited Type 304 stainless steel
Author(s) -
Shimizu K.,
Habazaki H.,
Skeldon P.,
Thompson G. E.,
Wood G. C.
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200011)29:11<743::aid-sia921>3.0.co;2-q
Subject(s) - materials science , sputtering , alloy , glow discharge , oxide , nickel , layer (electronics) , metallurgy , chromium , thin film , substrate (aquarium) , hydrogen , nickel oxide , analytical chemistry (journal) , composite material , plasma , chemistry , nanotechnology , physics , organic chemistry , chromatography , quantum mechanics , geology , oceanography
An air‐formed film, ∼2 nm thick, on sputter‐deposited Type 304 stainless steel has been analysed by glow discharge optical emission spectroscopy (GDOES) depth profiling. The distributions of iron, chromium, nickel and hydrogen in the film and alloy substrate have been revealed, with excellent depth resolution. The film consists of two distinct layers: an outer iron oxide layer and an inner oxide layer highly enriched with chromium oxide. Further, a thin nickel‐enriched layer is evident in the alloy immediately beneath the oxide film. The implications of these findings for the structure and mechanism of growth of the film are discussed. Copyright © 2000 John Wiley & Sons, Ltd.