Premium
Thin film analysis of chromium‐phosphate conversion coatings on aluminium probed by ToF‐SIMS and electron probe x‐ray analysis
Author(s) -
Cuynen Erik,
Goeminne Gudrun,
Espen Pierre Van,
Terryn Herman
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<589::aid-sia706>3.0.co;2-n
Subject(s) - aluminium , chromium , coating , electron probe microanalysis , layer (electronics) , microanalysis , analytical chemistry (journal) , phosphate , materials science , duplex (building) , fluorine , elemental analysis , electron microprobe , chemistry , metallurgy , inorganic chemistry , nanotechnology , chromatography , dna , biochemistry , organic chemistry
Time‐of‐flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrP x O y as the layer thickens, yielding a duplex layer structure. Electron probe x‐ray microanalysis was used to assess the variation in elemental composition of the coating. Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright @ 2000 John Wiley & Sons, Ltd.