Thin film analysis of chromium‐phosphate conversion coatings on aluminium probed by ToF‐SIMS and electron probe x‐ray analysis | Zendy

Cuynen Erik | Zendy; Goeminne Gudrun | Zendy; Espen Pierre Van | Zendy; Terryn Herman | Zendy

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Thin film analysis of chromium‐phosphate conversion coatings on aluminium probed by ToF‐SIMS and electron probe x‐ray analysis

Author(s) -

Cuynen Erik,

Goeminne Gudrun,

Espen Pierre Van,

Terryn Herman

Publication year - 2000

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/1096-9918(200008)30:1<589::aid-sia706>3.0.co;2-n

Subject(s) - aluminium , chromium , coating , electron probe microanalysis , layer (electronics) , microanalysis , analytical chemistry (journal) , phosphate , materials science , duplex (building) , fluorine , elemental analysis , electron microprobe , chemistry , metallurgy , inorganic chemistry , nanotechnology , chromatography , dna , biochemistry , organic chemistry

Time‐of‐flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrP x O y as the layer thickens, yielding a duplex layer structure. Electron probe x‐ray microanalysis was used to assess the variation in elemental composition of the coating. Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright @ 2000 John Wiley & Sons, Ltd.

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