Premium Thin film analysis of chromium‐phosphate conversion coatings on aluminium probed by ToF‐SIMS and electron probe x‐ray analysisPremium
Author(s)
Cuynen Erik,
Goeminne Gudrun,
Espen Pierre Van,
Terryn Herman
Publication year2000
Publication title
surface and interface analysis
Resource typeJournals
PublisherJohn Wiley & Sons
Abstract Time‐of‐flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrP x O y as the layer thickens, yielding a duplex layer structure. Electron probe x‐ray microanalysis was used to assess the variation in elemental composition of the coating. Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright @ 2000 John Wiley & Sons, Ltd.
Subject(s)aluminium , analytical chemistry (journal) , biochemistry , chemistry , chromatography , chromium , coating , dna , duplex (building) , electron microprobe , electron probe microanalysis , elemental analysis , fluorine , inorganic chemistry , layer (electronics) , materials science , metallurgy , microanalysis , nanotechnology , organic chemistry , phosphate
Language(s)English
SCImago Journal Rank0.52
H-Index90
eISSN1096-9918
pISSN0142-2421
DOI10.1002/1096-9918(200008)30:1<589::aid-sia706>3.0.co;2-n
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