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Construction of an ELS–LEED: an electron energy‐loss spectrometer with electrostatic two‐dimensional angular scanning
Author(s) -
Nagao Tadaaki,
Hasegawa Shuji
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<488::aid-sia755>3.0.co;2-r
Subject(s) - spectrometer , monochromator , analyser , optics , diffraction , resolution (logic) , deflection (physics) , electron spectrometer , low energy electron diffraction , full width at half maximum , electron , chemistry , atomic physics , electron diffraction , physics , cathode ray , wavelength , quantum mechanics , artificial intelligence , computer science
A new version of an energy‐loss spectrometer with low‐energy electron diffraction (ELS–LEED, Henzler type EELS) has been constructed. Different from the prototype spectrometer, which is equipped with a single‐pass 127° cylindrical deflector analyser, the present spectrometer consists of an Ibach‐type double‐pass monochromator, an enlarged single‐pass analyser and some magnetic lenses in acceleration and deceleration lenses and in the electrostatic deflection unit for high‐resolution LEED. As a preliminary result, with the Si(111)−7 × 7 surface, the present spectrometer showed an energy width (full with at half‐maximum) of 18 meV at the quasi‐elastic peak and a transfer width of 960 Å at the (00) diffraction spot. Copyright © 2000 John Wiley & Sons, Ltd.