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TEY‐XANES spectra of chromium thin films on iron measured with grazing incident synchrotron radiation
Author(s) -
Nagoshi Masayasu,
Okude Nobuya,
Kobayashi Katsumi
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<472::aid-sia837>3.0.co;2-2
Subject(s) - xanes , synchrotron radiation , spectral line , absorption (acoustics) , analytical chemistry (journal) , absorption edge , materials science , synchrotron , chromium , optics , chemistry , physics , optoelectronics , band gap , metallurgy , chromatography , astronomy
Total electron yield (TEY) x‐ray absorption near‐edge structure (XANES) spectra were measured with grazing incident synchrotron radiation for Cr thin films on Fe in order to investigate the feasibility of the technique for surface analysis. The minimum detection depth of TEY‐XANES with the grazing incident x‐rays is 2–20 nm for the Cr films studied. The spectral shapes of both Cr K‐edge and Fe K‐edge spectra are changed at incident angles between 0.1° and 3–5°. These results are discussed by x‐ray absorption depths, electron penetration lengths and total reflection in terms of the applicability of TEY‐XANES with grazing incident x‐rays for chemical‐state analysis of material surfaces. Copyright © 2000 John Wiley & Sons, Ltd.