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Degradation of ZnS FED phosphors
Author(s) -
Swart H. C.,
Hillie K. T.
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<383::aid-sia779>3.0.co;2-v
Subject(s) - cathodoluminescence , phosphor , auger electron spectroscopy , cathode ray , analytical chemistry (journal) , field electron emission , chemistry , scanning electron microscope , luminescence , degradation (telecommunications) , electron beam induced deposition , materials science , excited state , electron , atomic physics , optoelectronics , scanning transmission electron microscopy , composite material , telecommunications , physics , chromatography , quantum mechanics , computer science , nuclear physics
The degradation of cathodoluminescent brightness under prolonged electron beam excitation of phosphors has been identified as one of the outstanding critical issues for the flat‐panel field emission industries. The ZnS : Cu,Al,Au phosphor powders have been subjected to electron beam bombardment of 2 keV with different electron beam current densities (2.5–88 mA cm −2 ) at an oxygen pressure of 1 × 10 −6 Torr. Auger electron spectroscopy (AES) and cathodoluminescence, both excited by the same electron beam, were used to monitor changes in surface composition and luminous efficiency during electron bombardment. Degradation was manifested by a non‐luminescent ZnO layer that formed on the surface of the phosphor according to electron‐stimulated surface chemical reaction (ESSCR). Lower current densities lead to a higher surface reaction rate, due to a lower local temperature beneath the beam, which resulted in more severe cathodoluminescence degradation. A lower temperature beneath the electron beam may lead to an increase in the surface reaction rate due to the longer time spent by the adsorbed molecules on the surface, with a direct increase in the ESSCR probability. Copyright © 2000 John Wiley & Sons, Ltd.