Premium
Surface chemistry of end cuts from Athabasca bitumen
Author(s) -
Bensebaa Farid,
Kotlyar Luba,
Pleizier Gerald,
Sparks Bryan,
Deslandes Yves,
Chung Keng
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<207::aid-sia816>3.0.co;2-5
Subject(s) - asphalt , oil sands , chemistry , mineralogy , materials science , composite material
Bitumen components, responsible for various processing problems, were analysed with x‐ray photoelectron spectroscopy (XPS), time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and photoacoustic Fourier transform infrared spectrometry (PAS–FTIR). These methods were selected because they can probe surfaces to different depths: ToF‐SIMS explores the surface to a depth of ∼1 nm; XPS analyses a surface layer 7 nm deep; and PAS–FTIR probes layers several micrometres thick. Copyright © 2000 John Wiley & Sons, Ltd.