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Angle‐resolved XPS for determination of diffusion coefficients and mobilities of cations in thin passive films
Author(s) -
Asami Katsuhiko,
Akiyama Eiji,
Hashimoto Koji
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)30:1<106::aid-sia768>3.0.co;2-3
Subject(s) - x ray photoelectron spectroscopy , diffusion , amorphous solid , analytical chemistry (journal) , alloy , polarization (electrochemistry) , anode , materials science , chemistry , crystallography , thermodynamics , nuclear magnetic resonance , metallurgy , electrode , physics , chromatography
Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) in combination with the generalized Fick's first law was applied to determine diffusion coefficients and mobilities of cations in passive films formed by anodic polarization on amorphous Al–Cr–Mo and Al–Ti–Mg alloys. The depth profiles of cations in the surface films were fitted to a depth distribution model expected from Fick's first law. From the fitting parameters, the diffusion coefficients and mobilities of Al, Cr and Ti cations in anodic films formed on Al–Cr–Mo and Al–Ti–Mg alloys were determined. Diffusion coefficients of cation M in the anodic film, D (M), were as follows: D (Al) = 4.02 × 10 −19 cm 2 s −1 and D (Cr) = 6.51 × 10 −19 cm 2 s −1 for Al–36Cr–9Mo Alloy; and D (Al) = 3.18 × 10 −19 and D (Ti) = 2.36 × 10 −19 cm 2 s −1 for Al–36Ti–7Mg Alloy. The mobility ratios were µ Cr /µ Al = 1.62 and µ Ti /µ Al = 0.74, although both Cr and Ti were enriched in the surface region of the anodic films. Copyright © 2000 John Wiley & Sons, Ltd.