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Surface characterization of poly(styrene‐ co ‐ p ‐hexafluorohydroxyisopropyl‐α‐methyl styrene) copolymers by ToF‐SIMS, XPS and contact angle measurements
Author(s) -
Liu Shiyong,
Weng LuTao,
Chan ChiMing,
Li Lin,
Ho KaChun,
Jiang Ming
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200008)29:8<500::aid-sia893>3.0.co;2-8
Subject(s) - x ray photoelectron spectroscopy , contact angle , copolymer , styrene , polystyrene , analytical chemistry (journal) , secondary ion mass spectrometry , polymer chemistry , materials science , surface energy , chemistry , mass spectrometry , polymer , chemical engineering , organic chemistry , chromatography , composite material , engineering
A series of spin‐cast films of poly(styrene‐ co ‐ p ‐hexafluorohydroxyisopropyl‐α‐methyl styrene) (poly(St‐ co ‐HFMS)) copolymers were analysed by x‐ray photoelectron spectroscopy (XPS), time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and contact angle measurements. The XPS results showed that the surface chemical composition of the copolymers was the same as that of the bulk. The water contact angle decreased slightly with the HFMS content, indicating that there was no fluorine segregation on the surface. This result showed that the decrease of the surface energy due to the presence of the fluorinated groups was offset by the presence of the polar hydroxyl group. The characteristic peaks of poly(St‐ co ‐HFMS) could be distinguished from those of polystyrene in both positive and negative ToF‐SIMS spectra. Our analyses have demonstrated that normalized peak intensities and relative intensities of the characteristic peaks can produce useful quantitative results. Copyright © 2000 John Wiley & Sons, Ltd.