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Standard test data for estimating peak parameter errors in x‐ray photoelectron spectroscopy: II. Peak intensities
Author(s) -
Conny J. M.,
Powell C. J.
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200007)29:7<444::aid-sia888>3.0.co;2-m
Subject(s) - spectral line , x ray photoelectron spectroscopy , analytical chemistry (journal) , intensity (physics) , chemistry , computational physics , nuclear magnetic resonance , physics , optics , chromatography , astronomy