Premium
Characterization of synthesized lacquer analogue films using x‐ray photoelectron spectroscopy
Author(s) -
Niimura Noriyasu,
Miyakoshi Tetsuo
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/1096-9918(200006)29:6<381::aid-sia881>3.0.co;2-i
Subject(s) - lacquer , x ray photoelectron spectroscopy , autoxidation , polymerization , materials science , polymer chemistry , hardening (computing) , nuclear chemistry , polymer , chemistry , chemical engineering , organic chemistry , composite material , coating , engineering , layer (electronics)
Four kinds of synthesized lacquer analogue films were characterized using x‐ray photoelectron spectroscopy (XPS) and the pencil hardness testing method. The results were compared with natural lacquer film. Laccase‐catalysed oxidative polymerization and autoxidation have been found to contribute to the hardening of the synthesized lacquer analogue. Plant gum and glycoproteins are concentrated in the surface of the synthesized lacquer film during hardening, as with the natural lacquer films. Furthermore, synthesized urushiol analogues, in which side chains are richer in the double bond, polymerize into harder lacquer films and concentrate more oxygen and nitrogen in the film surface with proportionately more COO, CO, COC and CN functional groups. The synthesized lacquer films are brilliant and tough like the natural lacquer film. Copyright © 2000 John Wiley & Sons, Ltd.