Open AccessAppendix D: On the Scan Versus the Embedded Impedance
Author(s) -
Ben A. Munk
Publication year - 2003
Language(s) - English
Resource type - Reports
DOI - 10.1002/0471457531.app4
Subject(s) - electrical impedance , measure (data warehouse) , high impedance , image impedance , impedance matching , acoustics , materials science , damping factor , physics , engineering , computer science , electrical engineering , database
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