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Real‐Time Observation of Temperature Rise and Thermal Breakdown Processes in Organic LEDs Using an IR Imaging and Analysis System
Author(s) -
Zhou X.,
He J.,
Liao L. S.,
Lu M.,
Ding X. M.,
Hou X. Y.,
Zhang X. M.,
He X. Q.,
Lee S. T.
Publication year - 2000
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/(sici)1521-4095(200002)12:4<265::aid-adma265>3.0.co;2-l
Subject(s) - oled , materials science , indium tin oxide , optoelectronics , indium , electric field , diode , infrared , electromigration , thermal , thermal stability , layer (electronics) , nanotechnology , optics , composite material , physics , quantum mechanics , meteorology
Organic light‐emitting diodes (OLEDs) have enjoyed significant progress in terms of practical applications; however, their lifetimes are often limited by poor thermal stability. These authors have monitored the surface temperature of working OLED devices and identified “hot spots” due to electrical shorting using an infrared imaging and analysis system. Thermal breakdown in the devices is shown to have its origins in the electric‐field‐induced decomposition of indium tin oxide and electromigration of indium through the organic layer under high electric field.