Premium
Role of Electrode Contamination in Electron Injection at Mg:Ag/Alq 3 Interfaces
Author(s) -
Shen C.,
Hill I. G.,
Kahn A.
Publication year - 1999
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/(sici)1521-4095(199912)11:18<1523::aid-adma1523>3.0.co;2-k
Subject(s) - oled , materials science , electrode , contamination , optoelectronics , diode , aluminium , oxygen , electron , analytical chemistry (journal) , nanotechnology , composite material , organic chemistry , chemistry , ecology , physics , quantum mechanics , biology , layer (electronics)
The environment in which organic light‐emitting diodes (OLEDs) are fabricated can profoundly affect device performance, as shown here. The previously reported asymmetric injection behavior of Mg:Ag/Alq 3 /Mg:Ag structures (where Alq 3 is tris(8‐hydroxyquinoline) aluminum) is investigated by fabricating and testing these structures under ultra‐high vacuum with and without exposing the bottom electrode to oxygen and water vapor. It is demonstrated that devices fabricated under strict vacuum conditions exhibit symmetric I – V characteristics while those exposed to air do not.