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Low Energy Electron Degradation of Poly( p ‐phenylenevinylene)
Author(s) -
Bröms Per,
Johansson Nicklas,
Gymer Richard W.,
Graham Stephen C.,
Friend Richard H.,
Salaneck William R.
Publication year - 1999
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/(sici)1521-4095(199907)11:10<826::aid-adma826>3.0.co;2-n
Subject(s) - materials science , electroluminescence , cathode ray , degradation (telecommunications) , electron , quenching (fluorescence) , polymer , layer (electronics) , electron beam physical vapor deposition , evaporation , electron beam processing , secondary electrons , beam (structure) , optoelectronics , photochemistry , nanotechnology , optics , fluorescence , composite material , physics , chemistry , chemical vapor deposition , telecommunications , quantum mechanics , computer science , thermodynamics
Quenching of the electroluminescence of polymer LEDs by the application of an aluminum protective layer by electron‐beam evaporation has been investigated. It is shown that the secondary electrons present whenever the electron beam is on are responsible for the degradation. The Figure illustrates how the poly (p‐phenylene vinylene) device was masked to rule out the involvement of X‐rays.