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Ultrathin Electroactive Junctions Assembled from Silicon Nanocrystallites and Polypyrrole
Author(s) -
SwerydaKrawiec Beata,
Cassagneau Thierry,
Fendler Janos H.
Publication year - 1999
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/(sici)1521-4095(199906)11:8<659::aid-adma659>3.0.co;2-r
Subject(s) - materials science , polypyrrole , silicon , porous silicon , wafer , colloid , sonication , nanotechnology , chemical engineering , layer (electronics) , covalent bond , optoelectronics , polymer , polymerization , composite material , organic chemistry , chemistry , engineering
Rectifying junctions prepared from silicon nanocrystals (Si‐nc) by a wet colloid chemical approach are reported. The ultrathin junctions consisted of a derivatized p‐ or n‐type silicon wafer, to which colloidal Si‐nc—prepared by sonication of porous silicon in toluene—was attached covalently by self‐assembly, and a polypyrrole layer (see Figure). The rectification behavior of various junctions is described.