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Chemical Contrast on a Microphase‐Separated Block Copolymer Surface Observed by Scanning Force Microscopy
Author(s) -
Werts Michel P. L.,
van der Vegte Eric W.,
Grayer Valérie,
Esselink Eddy,
Tsitsilianis Constantinos,
Hadziioannou Georges
Publication year - 1998
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/(sici)1521-4095(199804)10:6<452::aid-adma452>3.0.co;2-1
Subject(s) - copolymer , materials science , polystyrene , scanning force microscopy , morphology (biology) , polymer , atomic force microscopy , scanning electron microscope , composite material , polymer chemistry , polymer science , nanotechnology , biology , genetics
Friction force imaging of microphase‐separated copolymers using scanning force microscopy (SFM) is demonstrated to be a viable technique for distinguishing between polymer blocks. The Figure is a friction force image of a cross section of a film of a polystyrene‐poly(2 vinylpyridine) (PS‐PVP) star copolymer measured with a COOH‐modified tip, revealing the morphology of the copolymer.