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Structure and Ordering Principles of Ultrathin Organic Molecular Films on Surfaces of Layered Semiconductors Organic‐on‐Inorganic MBE
Author(s) -
Karl N.,
Guenther Ch.
Publication year - 1999
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/(sici)1521-4079(199902)34:2<243::aid-crat243>3.0.co;2-5
Subject(s) - organic semiconductor , semiconductor , molecular beam epitaxy , materials science , epitaxy , electron diffraction , thin film , thermal desorption , desorption , planar , naphthalene , deposition (geology) , graphite , molecule , diffraction , crystallography , chemistry , nanotechnology , optoelectronics , optics , organic chemistry , adsorption , layer (electronics) , computer graphics (images) , computer science , composite material , biology , paleontology , physics , sediment
Epitaxially ordered thin films of large planar organic molecules can be obtained on layered inorganic semiconductors by organic molecular beam deposition in UHV. Analysis by low energy electron diffraction (LEED) and thermal desorption spectroscopy (TDS) yields structural parameters and binding energies. The conditions necessary for order formation are analyzed. Epitaxial data are given for hexabenzocoronene (HBC) and naphthalene‐tetracarboxylic‐dianhydride (NTCDA) on graphite, MoS 2 and GeS.