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Characterization of Flat and Bent Crystals for X‐ray Spectroscopy and Imaging
Author(s) -
Hölzer G.,
Wehrhan O.,
Förster E.
Publication year - 1998
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/(sici)1521-4079(1998)33:4<555::aid-crat555>3.0.co;2-q
Subject(s) - bent molecular geometry , reflection (computer programming) , characterization (materials science) , physics , optics , x ray , crystallography , materials science , chemistry , computer science , composite material , programming language
Theoretical and experimental methods for the characterization of the reflection properties of flat and bent crystals are presented. The computer code DIXI for the simulation of reflection curves in the Bragg case is briefly described. Essential effects of the dynamical theory of x‐ray diffraction are illustrated with selected examples. Results from diffractometric and topographic methods for quality control of bent crystals are presented.