Premium
Long‐Wave‐Infrared Near‐Field Microscopy
Author(s) -
Keilmann F.,
Knoll B.,
Kramer A.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199909)215:1<849::aid-pssb849>3.0.co;2-l
Subject(s) - optics , near field scanning optical microscope , infrared , scanning tunneling microscope , scattering , microscopy , microwave , wavelength , materials science , vibrational analysis with scanning probe microscopy , dipole , resolution (logic) , infrared microscopy , optical microscope , physics , nanotechnology , scanning electron microscope , quantum mechanics , artificial intelligence , computer science
We have extended scanning near‐field optical microscopy to work at long wavelengths with sub‐μm resolution. This allows to exploit the rich spectroscopic signatures of vibrations and other low‐energy excitations for nano‐scale imaging. The experiment uses an “apertureless” metal probe tip which at the same time serves as force and tunneling probe tip to acquire the surface topography. The applied microwave or infrared wave generates an enhanced longitudinal field at the tip apex. The tip scattering is recorded with a resolution of about 100 nm, a limit given by the tip diameter. Surface‐enhanced infrared absorption contrast is observed as predicted by a model which treats the combined scattering of the tip dipole together with its mirror dipole in the sample.