Premium
Linear Optical Properties of Si Surfaces and Nanostructures
Author(s) -
Rossow U.,
Mantese L.,
Aspnes D. E.,
Bell K. A.,
Ebert M.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199909)215:1<725::aid-pssb725>3.0.co;2-c
Subject(s) - nanostructure , materials science , ellipsometry , surface (topology) , spectroscopy , reflectivity , spectral line , optoelectronics , optics , nanotechnology , thin film , physics , mathematics , geometry , quantum mechanics , astronomy
We review the optical responses of Si surfaces and nanostructures (porous Si) as measured by reflectance‐difference spectroscopy and spectroscopic ellipsometry. We discuss a model of the optical responses of surfaces where the surface contributes indirectly through many‐body effects and by dynamically modifying an apparent bulk response as well as directly usually involving surface states. Indirect processes dominate the spectra of chemically saturated Si surfaces. The results suggest a close relationship among the optical properties of surfaces, interfaces, and nanostructures, and show that a complete description requires time dependences and many‐body effects to be included.