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Scanning Near‐Field Fluorescence Microscopy of Conjugated Polymers
Author(s) -
Stevenson R.,
Granström M.,
Richards D.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199909)215:1<65::aid-pssb65>3.0.co;2-t
Subject(s) - near field scanning optical microscope , materials science , optical microscope , polymer , conjugated system , microscopy , fluorescence microscope , fluorescence , nanometre , methyl methacrylate , resolution (logic) , scanning probe microscopy , optics , nanotechnology , scanning electron microscope , polymerization , composite material , physics , artificial intelligence , computer science
Fluorescence scanning near‐field optical microscopy (SNOM) with a spatial resolution of ≈150 nm is used to investigate blends of conjugated polymer derivatives of poly(p‐phenylene vinylene), PPV, in a poly(methyl methacrylate), PMMA, matrix. These blends phase‐segregate on a length scale of several hundred nanometers; using SNOM we are able to unambiguously identify the different phases from their fluorescence, and to identify material both on the surface and buried within a thin transparent film.