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The Far‐Infrared In‐Plane Conductivity of YBaCuO Studied by Ellipsometry
Author(s) -
Golnik A.,
Bernhard C.,
Humliček J.,
Kläser M.,
Cardona M.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199909)215:1<553::aid-pssb553>3.0.co;2-g
Subject(s) - far infrared , ellipsometry , conductivity , materials science , plane (geometry) , infrared , optics , chemistry , physics , nanotechnology , mathematics , thin film , geometry
We present far‐infrared ellipsometric measurements of the in‐plane ( a ‐axis) complex dielectric function of an untwinned YBa 2 Cu 3 O 6.9 single crystal. The relatively small sample size and the high angle of incidence (85°) make it necessary that we take into account diffraction effects.