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Phonons in Wurtzite Aluminum Nitride
Author(s) -
SchwoererBöhning M.,
Macrander A. T.,
Pabst M.,
Pavone P.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199909)215:1<177::aid-pssb177>3.0.co;2-8
Subject(s) - wurtzite crystal structure , phonon , nitride , aluminium , materials science , inelastic scattering , scattering , condensed matter physics , symmetry (geometry) , hexagonal crystal system , crystallography , optics , physics , nanotechnology , composite material , chemistry , mathematics , geometry , layer (electronics)
We present data obtained with inelastic X‐ray scattering measurements of the phonon dispersions in hexagonal aluminum nitride along all three high‐symmetry directions. These are the first such data for AlN. Presently available single crystals are large enough to perform an inelastic X‐ray scattering experiment. The results are compared with first‐principles calculations. We find excellent agreement between the data and the calculations.