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Electrodynamic c‐Axis Properties of YBa 2 Cu 3 O 7—δ Thin Films in the THz Frequency Regime
Author(s) -
Ludwig Ch.,
Sekinger T.,
Kuhl J.,
Habermeier H.U.,
Tani M.,
Sakai K.,
Hangyo M.,
Miyazawa S.,
Mukaida M.
Publication year - 1999
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199906)213:2<405::aid-pssb405>3.0.co;2-#
Subject(s) - terahertz radiation , thin film , materials science , optoelectronics , condensed matter physics , physics , nanotechnology
Using coherent THz pulse spectroscopy, we have analyzed the electrodynamic properties of thin YBa 2 Cu 3 O 7— δ films in the temperature range between 10 and 300 K. The temperature dependence of the London penetration depth in c ‐axis direction determined from the complex conductivity yields clear evidence for d‐wave symmetry of the order parameter.

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