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The Origin of the Berreman Effect in SiC Homostructures
Author(s) -
Zollner St.,
Carrejo J. P.,
Tiwald T. E.,
Woollam J. A.
Publication year - 1998
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199807)208:1<r3::aid-pssb99993>3.0.co;2-x
Subject(s) - electrical engineering , phone , engineering physics , physics , telecommunications , engineering , philosophy , linguistics