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Piezooptical Properties of Si
Author(s) -
Theodorou G.,
Tsegas G.
Publication year - 1998
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/(sici)1521-3951(199806)207:2<541::aid-pssb541>3.0.co;2-w
Subject(s) - materials science
The deformation potentials and the piezooptical properties of Si, for strain along the [001] and [111] directions, are investigated with the use of a realistic empirical tight‐binding model. The values, as well as their sign, of the deformation potential constants D 1 1 , D 5 1 , D 3 3 , and D 5 3 for the variation of the critical energy E 1 are evaluated for uniaxial and biaxial strain. The sign is found to be negative for D 1 1 , D 3 3 , and D 5 3 , and positive for D 5 1 . The dielectric function of Si under pressure, as well as the reflectivity and the linear piezooptical tensor components P 11 (ω), P 12 (ω) and P 44 (ω) are also evaluated. The main structures in P ij are located around the critical points E 1 and E 2 .